Cypress Semiconductor CY7C1365C Spezifikationsblatt - Seite 11
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Capacitance
Parameter
C
Input Capacitance
IN
C
Clock Input Capacitance
CLK
C
Input/Output Capacitance
I/O
[10]
Thermal Resistance
Parameter
Θ
Thermal Resistance
JA
(Junction to Ambient)
Θ
Thermal Resistance
JC
(Junction to Case)
AC Test Loads and Waveforms
3.3V I/O Test Load
OUTPUT
Z
= 50Ω
0
V
= 1.5V
T
(a)
2.5V I/O Test Load
OUTPUT
Z
= 50Ω
0
V
= 1.25V
T
(a)
Notes:
10. Tested initially and after any design or process change that may affect these parameters.
Document #: 38-05690 Rev. *E
Description
Description
Test conditions follow standard test
methods and procedures for
measuring thermal impedance, per
EIA/JESD51
3.3V
OUTPUT
R
= 50Ω
L
5 pF
INCLUDING
JIG AND
SCOPE
2.5V
OUTPUT
R
= 50Ω
L
5 pF
INCLUDING
JIG AND
SCOPE
Test Conditions
T
= 25°C, f = 1 MHz,
A
V
= 3.3V
DD
V
= 2.5V
DDQ
Test Conditions
R = 317Ω
V
DDQ
10%
GND
R = 351Ω
≤ 1 ns
(b)
R = 1667Ω
V
DDQ
10%
GND
R =1538Ω
≤ 1 ns
(b)
CY7C1365C
100 TQFP
Max.
Unit
5
pF
5
pF
5
pF
100 TQFP
Package
Unit
°C/W
29.41
°C/W
6.13
ALL INPUT PULSES
90%
90%
10%
≤ 1 ns
(c)
ALL INPUT PULSES
90%
90%
10%
≤ 1 ns
(c)
Page 11 of 18
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