Cypress Semiconductor STK15C88 Spezifikationsblatt - Seite 7

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Data Retention and Endurance
Parameter
DATA
Data Retention
R
NV
Nonvolatile STORE Operations
C
Capacitance
In the following table, the capacitance parameters are listed.
Parameter
C
Input Capacitance
IN
C
Output Capacitance
OUT

Thermal Resistance

In the following table, the thermal resistance parameters are listed.
Parameter
Description
Θ
Thermal Resistance
JA
(Junction to Ambient)
Θ
Thermal Resistance
JC
(Junction to Case)

AC Test Conditions

Input Pulse Levels .................................................. 0 V to 3 V
Input Rise and Fall Times (10% - 90%)........................ <5 ns
Input and Output Timing Reference Levels ................... 1.5 V
Note
4. These parameters are guaranteed by design and are not tested.
Document Number: 001-50593 Rev. **
Description
[4]
Description
T
= 25°C, f = 1 MHz,
A
V
= 0 to 3.0 V
CC
Test Conditions
Test conditions follow standard test methods and
procedures for measuring thermal impedance,
per EIA / JESD51.
Figure 4. AC Test Loads
5.0V
Output
30 pF
Min
100
1,000
Test Conditions
[4]
R1 480Ω
R2
255Ω
STK15C88
Unit
Years
K
Max
Unit
5
pF
7
pF
28-SOIC
28-SOIC
Unit
(300 mil)
(330 mil)
°C/W
TBD
TBD
°C/W
TBD
TBD
Page 7 of 15
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