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4. Making Opto-electronic Component Measurements
Figure 4.
E/O Measurement Dialog
O/E Measurements
In this case, the E/O device must be de-embedded. Sometimes, the .s2p file of that device is available but, if not,
a two-step process is used. The MN4765B is connected to the E/O device (the MN4775A usually) and the VNA
tools are used to generate the .s2p file for the MN4775A by de-embedding the MN4765B. Now the DUT is
connected in place of the MN4765B and the MN4775A response is de-embedded instead. The calibration
coefficients are modified upon dialog exit and the resulting measurement response is that of the O/E device of
interest. If O/E match is of interest, a simple S22 measurement (assuming the configuration of
Figure
2) will
suffice.
ME7848A/E QSG
PN: 10410-00777 Rev. C
QSG-13