Cypress Semiconductor CY7C1297H Hoja de especificaciones - Página 8
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Capacitance
Parameter
C
Input Capacitance
IN
C
Clock Input Capacitance
CLK
C
Input/Output Capacitance
I/O
[9]
Thermal Resistance
Parameter
Description
Θ
Thermal Resistance
JA
(Junction to Ambient)
Θ
Thermal Resistance
JC
(Junction to Case)
AC Test Loads and Waveforms
3.3V I/O Test Load
OUTPUT
= 50Ω
Z
0
V
= 1.5V
T
(a)
2.5V I/O Test Load
OUTPUT
Z
= 50Ω
0
V
= 1.25V
T
(a)
Note:
9. Tested initially and after any design or process change that may affect these parameters.
Document #: 38-05669 Rev. *B
Description
Test Conditions
Test conditions follow standard test methods and
procedures for measuring thermal impedance, per
EIA/JESD51
R = 317Ω
3.3V
OUTPUT
R
= 50Ω
L
5 pF
INCLUDING
JIG AND
(b)
SCOPE
R = 1667Ω
2.5V
OUTPUT
R
= 50Ω
L
5 pF
INCLUDING
JIG AND
SCOPE
(b)
Test Conditions
T
= 25°C, f = 1 MHz,
A
V
= 3.3V.
DD
V
= 2.5V
DDQ
ALL INPUT PULSES
V
DDQ
10%
GND
R = 351Ω
≤ 1 ns
ALL INPUT PULSES
V
DDQ
10%
GND
R =1538Ω
≤ 1 ns
CY7C1297H
100 TQFP
Max.
Unit
5
pF
5
pF
5
pF
100 TQFP
Package
Unit
°C/W
30.32
°C/W
6.85
90%
90%
10%
≤ 1 ns
(c)
90%
90%
10%
1 ns
≤
(c)
Page 8 of 15
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