Olympus SZX2-ILLC10 Manuel d'instructions - Page 13

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1. Table of Contents
2. Important - be Sure to Read this Chapter for Safe Use of the Equipment
3. Assembly

Observing the Specimen

A)Observing an IC chip, wafer, etc.

1. Brighten the field of view by turning the quarter-wave plate rotation

annulus.

2. If the field of view is too bright and glaring, adjust the brightness as

described in

above.

B)Reflected light polarized observation of liquid crystal, etc.

1. Perform Cross-Nicol observation (with the darkest field of view).

2. For accurate Cross-Nicol adjustment, place a flat, mirror-surfaced speci-

men on the specimen and make the field of view as dark as possible

by turning the quarter-wave plate rotation annulus.

3. Observe the specimen by rotating it on a horizontal plane.

SZX2-ILLC16/ILLC10