A.H. Systems CPF-630 Manuale di istruzioni - Pagina 4

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A.H. Systems Injection Current Probe Series

GENERAL INFORMATION

INTENDED PURPOSES

This equipment is intended for general laboratory use in a wide variety of

industrial and scientific applications, and designed to be used in the

process of generating, controlling and measuring high levels of

electromagnetic Radio Frequency (RF) energy. It is the responsibility of

the user to assure that the device is operated in a location which will

control the radiated energy such that it will not cause injury and will not

violate regulatory levels of electromagnetic interference.

GENERAL DESCRIPTION

The current probe fixture is composed of an electrically short section of

trough transmission line. The short section permits the measurement of

current in the center conductor of the line, while the current probe is

clamped around the center conductor. The fixture's output terminal is

terminated in a 50 receiver, spectrum analyzer or RF voltmeter. A

measurement of the voltage developed by this RF voltmeter permits the

calculation of current flowing in the center conductor. The trough is large

enough to permit the current probe to be clamped around the center

conductor, with the outer conductor of the trough extending around the

current probe's outer shield.

A mechanical outline of the fixture and a typical injection probe mounted in

the fixture is shown in Figure 1. This fixture is useable over the frequency

range of 10 kHz to 400 MHz.

BROADBAND CURRENT PROBES (MONITOR PROBES)

During the equipment test a broadband current probe (monitoring probe) is

clamped around the same wire or wire bundle that the injection probe is

clamped around. The broadband current probe shall be calibrated for the

test frequencies and cable of operating with 1 ampere of RF current. The

broadband current probe shall be located approximately 5 cm from the

injection current probe.

INJECTION CURRENT PROBES

Injection current probes must be capable of injecting the specified current

levels into the circuit under test. Each probe has its own technical

description and model number, and each has its own individual technical

literature.

 A.H. Systems inc. – January 2017

REV B