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計測機器 FormFactor ACP40-GSG SeriesのPDF クイック・リファレンス・マニュアルをオンラインで閲覧またはダウンロードできます。FormFactor ACP40-GSG Series 4 ページ。 Probes
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Quick Reference Guide
ACP40-GSG-xxx Probes
Probe Cleaning
Clean the probe tips and connectors occasionally, or when you suspect contact problems. Follow your microwave cable or
network analyzer manufacturer instructions for cleaning the precision microwave connector.
For more information, visit www.formfactor.com.
Symptom
Probe is pulled to the side when
trying to land on the device
Intermittent electrical contact
Poor calibration accuracy
Poor calibration repeatability
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PN 153-231-B
Possible Causes
Cable applies strain on the probe
Dirty/contaminated probe tip
Dirty RF connectors
Probe overtravel is not sufficient
Positioner arm is not planarized after
mounting the probe
SOLT calibration is used above 10GHz
Cal kit is not defined correctly
Poor connection in the system
Defective cable
Large temperature variations in the lab
www.formfactor.com
Solution
Use positioner cable clamp to strain-relieve the probe
Clean the probe tip
Clean the RF connectors
Adjust the overtravel
Planarize the positioner arm
Use LR(R)M calibration
Verify your cal kit definitions
Check and retighten your RF connections
Check the cable using VNA transmission calibration
Switch to controlled temperature lab
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ACP40-GSG-xxx Probes • 4