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4. Making Opto-electronic Component Measurements
O/O Measurements
These measurements require de-embedding of both O/E and E/O devices and the pattern should be obvious
from the previous subsections. The O/O measurements described here are slightly different from those one
might conduct with optical power meters or optical spectrum analyzers in that the system monitors what
happens to the RF envelope. Broadband insertion loss results will be similar unless the O/O device has some
bandwidth-limiting properties that affect the envelope. Optical return loss is not corrected in this
measurement so fiber end preparation/care can have more of an effect. In all of the measurements, absolute
insertion phase has little meaning because of the (usually) very large electrical lengths represented by the
optical components. Group delay (a frequency derivative of phase) or deviation from linear phase are more
often the angular metrics of most interest.
In addition to the VectorStar Calibration and Measurement Guide, additional white papers (such as Wideband
Optical Modulator and Detector Characterization, available on the Anritsu website) and application notes are
available that discuss this measurement class.
QSG-14
PN: 10410-00777 Rev. C
ME7848A/E QSG