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試験装置 A.H. Systems CPF-630のPDF 取扱説明書をオンラインで閲覧またはダウンロードできます。A.H. Systems CPF-630 12 ページ。 Current probe fixture
A.H. Systems Injection Current Probe Series
2) At each test frequency, increase the signal level until a malfunction
occurs or until the specification current level is measured by the broadband
current probes.
Record the following:
Current from the Broadband Current Probe
Forward power injected
Reverse power injected
3) Repeat this test for all frequencies necessary. Measure enough
frequencies to be sure that all susceptibility levels have been determined.
4) At frequencies where the equipment under test shows susceptibility,
reduce the signal levels until the susceptibility stops. Record the same data
as in step 2.
SAFETY
Caution during all of these tests is advised. High RF voltages and currents
are being generated during these tests. Personnel conducting tests should
not come in contact with any exposed metallic items of the test setup.
Use extreme care when clamping current probes around uninsulated
conductors. It is advised to de-energize the test item during assembly and
disassembly of the test setup. Place all conductors passing through the
aperture of probes in the center of the aperture for additional voltage
breakdown protection. Do not permit the uninsulated current probe
connector and cable connectors to come in contact with the ground plane or
other adjacent conductors.
A.H. Systems inc. – January 2017
REV B
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