Advanced Measurement Technology ORTEC A-576 A-PAD 운영 및 서비스 매뉴얼 - 페이지 5
{카테고리_이름} Advanced Measurement Technology ORTEC A-576 A-PAD에 대한 운영 및 서비스 매뉴얼을 온라인으로 검색하거나 PDF를 다운로드하세요. Advanced Measurement Technology ORTEC A-576 A-PAD 11 페이지. Preamplifier, amplifier, discriminator with bias supply
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Preamplifier, Amplifier, Discriminator with Bias Supply
The ORTEC Model A-576 A-PAD is a single- wide
NIM module intended for performing alpha
spectroscopy and counting when used in conjunction
with a silicon surface barrier detector. The instrument
includes a variable detector bias supply, a
preamplifier, a shaping and stretching amplifier, a
biased amplifier, a test pulser, and a discriminator
(Fig. 1). The detector bias supply and the amplifier
have selectable polarity so that it can be ued with any
charged-particle silicon semiconductor detector.
Examples are ORTEC's conventional and
-
Si surface barrier detectors and its ion-
Ruggedized
implanted Si detectors.
1
ORTEC MODEL A-576 A-PAD
1. DESCRIPTION
The energy ranges controllable from the front panel
are 3 to 8 MeV, 4 to 7 MeV, 3 to 5 MeV, 4 to 6 MeV, 5
to 7 MeV, and 6 to 8 MeV. The internal test pulser can
provide a signal at 5 MeV, 6 MeV, or 7 MeV by
internal jumper selection.
In addition to the calibrated Energy output, the
COUNT front-panel BNC connector provides a NIM-
standard positive logic pulse for gross alpha counting
and/or routing. The DET BIAS MONITOR front-panel
test points permit monitoring detector leakage current
and detector bias voltage.