Anritsu Company VectorStar ME7848A-0140 빠른 시작 매뉴얼 - 페이지 11
{카테고리_이름} Anritsu Company VectorStar ME7848A-0140에 대한 빠른 시작 매뉴얼을 온라인으로 검색하거나 PDF를 다운로드하세요. Anritsu Company VectorStar ME7848A-0140 15 페이지. Opto-electronic network analyzer systems
Anritsu Company VectorStar ME7848A-0140에 대해서도 마찬가지입니다: 빠른 시작 매뉴얼 (17 페이지)
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• To study individual components (i.e., an E/O converter of interest is to be inserted into the path), the
other components need to be de-embedded. There are many ways to start this process, but for reasons of
maximum accuracy and traceability, the MN4765B O/E module is delivered with a characterization file
describing its behavior). After the non-DUT components have been de-embedded, the residual response
is that of the device of interest.
• Most transmission measurements in this class are relative (e.g., to get at 3 dB or 10 dB bandwidth) but
absolute responsivities can be extracted using the known optical power and the known absolute
responsivities of the system components.
• Measurements on 2- and 4-port VectorStar VNAs are possible that allow the coverage of differential and
dual devices. These measurements are not covered in detail here since the ME7848A system definitions
are 2-port-based, but upgrades are possible and more information is available in the VectorStar
Calibration and Measurement Guide, 10410-00318.
E/O Measurements
This is the simplest class where the E/O DUT is connected to the MN4765B calibration module (and patch cord
losses are usually neglected) and the MN4765B is de-embedded. In the VNA software is a dialog like that
shown below where the configuration is entered and the .s2p file describing the MN4765B is loaded. When this
dialog is exited, the calibration coefficients will be modified by the de-embedding file so the resulting
measurement represents the response of the DUT. If input match of the E/O device is of interest, a direct S11
measurement (assuming the configuration of
A screenshot of an E/O measurement dialog on VectorStar is shown in
configured and the characterization data for the O/E device are loaded and, upon hitting 'Done', the calibration
coefficients are updated on the instrument to de-embed the O/E characteristics.
ME7848A QSG
4. Making Opto-electronic Component Measurements
Figure
3; no de-embedding needed) will accomplish the task.
PN: 10410-00777 Rev. B
Figure
4. The measurement is
QSG-11