Cypress Semiconductor NoBL CY7C1352G Specification Sheet - Page 7

Browse online or download pdf Specification Sheet for Computer Hardware Cypress Semiconductor NoBL CY7C1352G. Cypress Semiconductor NoBL CY7C1352G 13 pages. 4-mbit (256k x 18) pipelined sram with nobl architecture

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Electrical Characteristics
Parameter
Description
I
Automatic CE
SB4
Power-down
Current—TTL Inputs
[11]
Capacitance
Parameter
C
Input Capacitance
IN
C
Clock Input Capacitance
CLK
C
Input/Output Capacitance
I/O
[11]
Thermal Resistance
Parameter
Description
Θ
Thermal Resistance
JA
(Junction to Ambient)
Θ
Thermal Resistance
JC
(Junction to Case)
AC Test Loads and Waveforms
3.3V I/O Test Load
OUTPUT
Z
= 50Ω
0
V
= 1.5V
T
(a)
2.5V I/O Test Load
OUTPUT
= 50Ω
Z
0
V
= 1.25V
T
(a)
Note:
11. Tested initially and after any design or process changes that may affect these parameters.
Document #: 38-05514 Rev. *D
[9, 10]
Over the Operating Range
Test Conditions
V
= Max, Device Deselected,
DD
≥ V
≤ V
V
or V
, f = 0
IN
IH
IN
IL
Description
Test Conditions
Test conditions follow standard test
methods and procedures for measuring
thermal impedance, per EIA/JESD51.
R = 317Ω
3.3V
OUTPUT
R
= 50Ω
L
5 pF
INCLUDING
JIG AND
(b)
SCOPE
R = 1667Ω
2.5V
OUTPUT
R
= 50Ω
L
5 pF
INCLUDING
JIG AND
(b)
SCOPE
(continued)
All speeds
Test Conditions
T
= 25°C, f = 1 MHz,
A
V
= 3.3V,
DD
V
= 3.3V
DDQ
V
DDQ
10%
GND
R = 351Ω
≤ 1 ns
V
DDQ
10%
GND
R = 1538Ω
≤ 1 ns
CY7C1352G
Min.
Max.
Unit
45
mA
100 TQFP
Max.
Unit
5
pF
5
pF
5
pF
100 TQFP
Package
Unit
30.32
°C/W
6.85
°C/W
1ns
ALL INPUT PULSES
90%
90%
10%
≤ 1 ns
(c)
ALL INPUT PULSES
90%
90%
10%
≤ 1 ns
(c)
Page 7 of 12
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