Dragonchip ESD Podręcznik - Strona 5

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Charged Device Model

(CDM)

2.3 Damage in an electronic device

Two kinds of damage from ESD:

1. Catastrophic damage

1.1. Electronic device is rendered inoperable immediately after the ESD

event.

1.2. A semiconductor junction or a connecting metallization could have been

damaged by ESD.

2. Latent damage

2.1. Electronic device appears to be working fine following the ESD event.

2.2. The sensitive circuitry could be damaged and fail to operate at some time

in the future

Five areas should we pay attention to:

1. Assembly

2. Test

3. Lab

4. Packing

5. Storage

Dragonchip

We bring silicon to life

The Prevention and Control of Electrostatic Discharge (ESD)

DragonFLASH

AppNote082

0 – 124V

125 – 249V

250 – 499V

500 – 999V

1000 – 1499V

1500 – 2999V

>= 3000V

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