Cypress Semiconductor STK11C68 Arkusz specyfikacji - Strona 6

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Capacitance
In the following table, the capacitance parameters are listed.
Parameter
Description
C
Input Capacitance
IN
C
Output Capacitance
OUT

Thermal Resistance

In the following table, the thermal resistance parameters are listed.
Parameter
Description
Θ
Thermal Resistance
JA
(Junction to Ambient)
Θ
Thermal Resistance
JC
(Junction to Case)

AC Test Conditions

Input Pulse Levels .................................................... 0V to 3V
Input Rise and Fall Times (10% to 90%) ...................... <5 ns
Input and Output Timing Reference Levels .................... 1.5V
Note
3. These parameters are guaranteed by design and are not tested.
Document Number: 001-50638 Rev. **
[3]
T
= 25°C, f = 1 MHz,
A
V
= 0 to 3.0V
CC
Test Conditions
Test conditions follow standard test methods
and procedures for measuring thermal
impedance, per EIA / JESD51.
Figure 4. AC Test Loads
5.0V
Output
30 pF
Test Conditions
[3]
R1 480Ω
R2
255Ω
STK11C68
Max
8
7
28-SOIC
28-CDIP
28-LCC
TBD
TBD
TBD
TBD
TBD
TBD
Page 6 of 16
Unit
pF
pF
Unit
°C/W
°C/W
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