Olympus DSX510i Руководство - Страница 7

Просмотреть онлайн или скачать pdf Руководство для Микроскоп Olympus DSX510i. Olympus DSX510i 29 страниц.

A Variety of Observation Methods, Freely Usable

Quickly and Easily Acquire the Images Required for Observation

Ideal for any industrial microscopic observation method, the DSX510 offers a variety of observation modes that deliver the high-

resolution images users expect from high-end optics.

Brightfield observation —

Darkfield observation —

the most common microscopic

the best way to identify

observation method.

defects. Illuminate images

from the side to emphasize

imperfections.

Choose the Observation Method with One Easy Click

With virtually every industrial observation method just a click

away, the DSX510 makes it easy to choose the right one for the

task at hand. No complicated adjustments needed — simply

choose between modes (brightﬁ eld, darkﬁ eld, MIX [BF + DF],

Differential Interference Contrast, polarized light) and start

creating high-end images that meet precise demands.

MIX (BF + DF)

Use BF and DF at the same

time, combining the best of BF

ease of observation with the

specific emphasis of DF defect

observation.

A click of a button delivers the required image on screen

DIC

Differential Interference

Polarized light observation —

Contrast observation —

a valuable technique for

ideal for inspecting uneven

eliminating glare on substrates.

surfaces or nanometer-level

Allows surfaces characteristics

imperfections.

to be accurately displayed.