Alcor AU9331 Техническое справочное руководство - Страница 16

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5.6 Latch-Up Test Results

Test Description: Latch-Up testing was performed at room ambient using an

IMCS-4600 system which applies a stepped voltage to one pin per device with

all other pins open except Vdd and Vss which were biased to 5 Volts and

ground respectively.

Testing was started at 5.0 V (Positive) or 0 V(Negative), and the DUT was

biased for 0.5 seconds.

If neither the PUT current supply nor the device current supply reached the

predefined limit (DUT=0 mA , Icc=100 mA), then the voltage was increased

by 0.1 Volts and the pin was tested again.

This procedure was recommended by the JEDEC JC-40.2 CMOS Logic

standardization committee.

Notes:

1. DUT: Device Under Test.

2. PUT: Pin Under Test.

1 Source

Untested

Input Tied

to V supply

Trigger

Source

Test Circuit : Positive Input/ output Overvoltage /Overcurrent

Icc Measurement

Vcc

under

DUT

GND

ELECTRICAL CHARACTERISTICS

V Supply

Untested

Output Open

Circuit