Cypress Semiconductor CY62148ESL Şartname Sayfası - Sayfa 4

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Capacitance
Tested initially and after any design or process changes that may affect these parameters.
Parameter
Description
C
Input Capacitance
IN
C
Output Capacitance
OUT

Thermal Resistance

Tested initially and after any design or process changes that may affect these parameters.
Parameter
Description
Θ
Thermal Resistance
JA
(Junction to Ambient)
Θ
Thermal Resistance
JC
(Junction to Case)
R1
V
CC
OUTPUT
30 pF
INCLUDING
JIG AND
SCOPE
Parameters
R1
R2
R
TH
V
TH
Document #: 001-50045 Rev. **
Test Conditions
T
= 25°C, f = 1 MHz,
A
V
= V
CC
CC(typ)
Test Conditions
Still Air, soldered on a 3 x 4.5 inch, two layer printed
circuit board
Figure 2. AC Test Loads and Waveforms
V
CC
R2
GND
Rise Time = 1 V/ns
Equivalent to:
THEVENIN
OUTPUT
2.50V
3.0V
16667
1103
15385
1554
8000
645
1.20
1.75
CY62148ESL MoBL
ALL INPUT PULSES
90%
10%
EQUIVALENT
R
TH
V
5.0V
1800
990
639
1.77
Max
Unit
10
pF
10
pF
STSOP
Unit
°C/W
49.02
°C/W
14.07
90%
10%
Fall Time = 1 V/ns
Unit
Ω
Ω
Ω
V
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