Dell PowerVault LTO4-120 Посібник користувача - Сторінка 15

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Dell PowerVault LTO4-120 Посібник користувача
Table 6-7
lists the basic environmental tolerances for LTO Ultrium cartridges.
Table 6-7. Environmental Tolerances
 
Specification
Maximum localized temperature-permanent tape damage
Operating temperature
Relative humidity (non-condensing)
Wet bulb temperature
If during storage and/or transportation a cartridge has been exposed to conditions outside the specified values, it must be conditioned before use in the
operating environment. The conditioning shall be exposure to the operating environment for a time equal to, or greater than, the time away from the
operating environment, up to a maximum of 24 hours. There shall be no deposit of moisture anywhere on or in the cartridge.
The stray magnetic field at any point on the tape shall not exceed 4000 A/m.
 

Cartridge Memory

Each Ultrium 1, Ultrium 2, and Ultrium 3 cartridge has 4 KB of nonvolatile memory:
3 KB are used to store tape-directory and hardware specific information.
l
1 KB is available for application and OEM use.
l
Each Ultrium 4 cartridge has 8 KB of nonvolatile memory:
4 KB are used to store tape-directory and hardware specific information.
l
128 bytes are used for error information.
l
4320 bytes are not used.
l
The cartridge memory is powered, read, and written to through a radio-frequency link.
 

Cartridge Reliability

After 5,000 load/eject cycles, replace the cartridge to insure data integrity.
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Value
Greater than 52° C
10° C to 45° C
20% to 80% storage,
10% to 80% operating
26° C max
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