Cypress Semiconductor CY7B9920 Spezifikationsblatt - Seite 5

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Capacitance
Tested initially and after any design or process changes that may affect these parameters.
Parameter
Description
C
Input Capacitance
IN
AC Test Loads and Waveforms
5V
R1=130
R1
R2=91
C
L
C
(Includes fixture and probe capacitance)
L
R2
7B9910–3
TTL AC Test Load (CY7B9910)
V
CC
R1=100
R2=100
R1
C
L
(Includes fixture and probe capacitance)
C
L
R2
7B9910–5
CMOS AC Test Load (CY7B9920)

Switching Characteristics

[11]
Over the Operating Range
Parameter
f
Operating Clock
NOM
Frequency in MHz
t
REF Pulse Width HIGH
RPWH
t
REF Pulse Width LOW
RPWL
t
Zero Output Skew (All Outputs)
SKEW
t
Device-to-Device Skew
DEV
t
Propagation Delay, REF Rise to FB Rise
PD
t
Output Duty Cycle Variation
ODCV
t
Output Rise Time
ORISE
t
Output Fall Time
OFALL
t
PLL Lock Time
LOCK
t
Cycle-to-Cycle Output Jitter Peak to Peak
JR
Document Number: 38-07135 Rev. *B
°
T
= 25
C, f = 1 MHz, V
A
= 50 pF (C
= 30pF for –5 and – 2 devices)
L
= 50 pF (C
=30 pF for –5 and – 2devices)
L
Description
[1, 2]
FS = LOW
[1, 2]
FS = MID
[1, 2, 3]
FS = HIGH
[13, 14]
[14, 15]
[16]
[17, 18]
[17, 18]
[19]
RMS
Test Conditions
= 5.0V
CC
2.0V
V
=1.5V
th
0.8V
0.0V
≤1ns
TTL Input Test Waveform (Cy7B9910)
80%
V
= V
/2
th
CC
20%
0.0V
≤ 3ns
CMOS Input Test Waveform (CY7B9920)
[8]
CY7B9910–2
Min
Typ
Max
15
30
25
50
40
80
5.0
5.0
0.1
0.25
0.75
–0.25
0.0
+0.25
–0.65
0.0
+0.65
0.15
1.0
1.2
0.15
1.0
1.2
0.5
200
25
CY7B9910
CY7B9920
Max
Unit
10
pF
3.0V
2.0V
V
=1.5V
th
0.8V
≤1ns
7B9910–4
V
CC
80%
V
= V
/2
th
CC
20%
≤ 3ns
7B9910–6
[8]
CY7B9920–2
Min
Typ
Max
15
30
MHz
25
50
[12]
40
80
5.0
ns
5.0
ns
0.1
0.25
ns
0.75
ns
–0.25
0.0
+0.25
ns
–0.65
0.0
+0.65
ns
0.5
2.0
2.5
ns
0.5
2.0
2.5
ns
0.5
ms
200
ps
25
ps
Page 5 of 11
Unit
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