Atlanta BYK spectro2profiler Glosario - Página 7

Navegue en línea o descargue pdf Glosario para Instrumentos de medida Atlanta BYK spectro2profiler. Atlanta BYK spectro2profiler 20 páginas. Explanation of terminology

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BYK-Gardner GmbH

Hs - Mean Hill Size (mm²)

The cross sections of the hills within the corresponding cells are detected. These

areas are averaged and the mean value is returned. The threshold height for

the cross section is parameterized (see below).

F% - Fill Factor

The ratio of mean hill size and mean cell size yield the fill factor.

CsMin - Cell Size Minimum (mm²)

The smallest cell size of all cells included into the data analysis.

CsMax - Cell Size Maximum (mm²)

The largest cell size of all cells included into the data analysis.

CsDev - Cell Size Deviation

The standard deviation (mm²) of the cell sizes divided through the Mean cell

size (mm²). The standard deviation is calculated based on the of the distribu-

tion of all individual cell sizes. Division by mean value ensures the comparabil-

ity of different structure types.

2.2 Fine Structures

R - Mean Reflectivity (a.u.)

The mean value of the reflectivity data. This is an absolute measurement. The

value is calibrated with the matt white tile. This camera standard is provided as

accessory. The unit is non-standard and thus an arbitrary unit (a.u.).

µRc - Micro Reflectivity Contrast

The topography data is separated into low and high reflectivity areas. The al-

gorithm calculates the two mean reflectivity values for the corresponding

areas. The contrast is calculated with the contrast formula contrast = (high –

low) / (high + low).

µPd - Micro Mean Peak Distance (µm)

The algorithm finds local maxima. The next neighbour distances for these max-

ima are calculated and an average value is returned.

µA - Micro Mean Local Amplitude (P-µm)

The algorithm finds local maxima and local minima. A local amplitude is calcu-

lated between a local maximum and its nearest minimum. All local amplitudes

are averaged, and the result is returned. The unit is perceived height based on

the measurement technology.

283 025 846 - 2008

spectro2profiler