Atlanta BYK spectro2profiler Woordenlijst - Pagina 7

Blader online of download pdf Woordenlijst voor {categorie_naam} Atlanta BYK spectro2profiler. Atlanta BYK spectro2profiler 20 pagina's. Explanation of terminology

Atlanta BYK spectro2profiler Woordenlijst
BYK-Gardner GmbH
Hs - Mean Hill Size (mm²)
The cross sections of the hills within the corresponding cells are detected. These
areas are averaged and the mean value is returned. The threshold height for
the cross section is parameterized (see below).
F% - Fill Factor
The ratio of mean hill size and mean cell size yield the fill factor.
CsMin - Cell Size Minimum (mm²)
The smallest cell size of all cells included into the data analysis.
CsMax - Cell Size Maximum (mm²)
The largest cell size of all cells included into the data analysis.
CsDev - Cell Size Deviation
The standard deviation (mm²) of the cell sizes divided through the Mean cell
size (mm²). The standard deviation is calculated based on the of the distribu-
tion of all individual cell sizes. Division by mean value ensures the comparabil-
ity of different structure types.

2.2 Fine Structures

R - Mean Reflectivity (a.u.)
The mean value of the reflectivity data. This is an absolute measurement. The
value is calibrated with the matt white tile. This camera standard is provided as
accessory. The unit is non-standard and thus an arbitrary unit (a.u.).
µRc - Micro Reflectivity Contrast
The topography data is separated into low and high reflectivity areas. The al-
gorithm calculates the two mean reflectivity values for the corresponding
areas. The contrast is calculated with the contrast formula contrast = (high –
low) / (high + low).
µPd - Micro Mean Peak Distance (µm)
The algorithm finds local maxima. The next neighbour distances for these max-
ima are calculated and an average value is returned.
µA - Micro Mean Local Amplitude (P-µm)
The algorithm finds local maxima and local minima. A local amplitude is calcu-
lated between a local maximum and its nearest minimum. All local amplitudes
are averaged, and the result is returned. The unit is perceived height based on
the measurement technology.
283 025 846 - 2008
spectro2profiler
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