Cypress Semiconductor CY7C1041DV33 사양 시트 - 페이지 4
{카테고리_이름} Cypress Semiconductor CY7C1041DV33에 대한 사양 시트을 온라인으로 검색하거나 PDF를 다운로드하세요. Cypress Semiconductor CY7C1041DV33 14 페이지. 4 mbit (256k x 16) static ram
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Capacitance
[6]
Parameter
Description
C
Input Capacitance
IN
C
IO Capacitance
OUT
Thermal Resistance
[6]
Parameter
Description
Θ
Thermal Resistance (Junction
JA
to Ambient)
Θ
Thermal Resistance (Junction
JC
to Case)
AC Test Loads and Waveforms
The AC test loads and waveform diagram follows.
10 ns device
OUTPUT
* CAPACITIVE LOAD CONSISTS
OF ALL COMPONENTS OF THE
TEST ENVIRONMENT
High-Z Characteristics
3.3V
OUTPUT
5 pF
(c)
Notes
6. Tested initially and after any design or process changes that may affect these parameters.
7. AC characteristics (except High-Z) are tested using the load conditions shown in
using the test load shown in (c).
Document #: 38-05473 Rev. *E
Test Conditions
T
= 25°C, f = 1 MHz, V
A
Test Conditions
Still Air, soldered on a 3 × 4.5 inch,
four layer printed circuit board
[7]
Z = 50Ω
50 Ω
30 pF*
1.5V
(a)
R 317Ω
R2
351Ω
Max
= 3.3V
8
CC
8
FBGA
Package
27.89
14.74
ALL INPUT PULSES
3.0V
90%
10%
GND
(b)
Rise Time: 1 V/ns
AC Test Loads and Waveforms
(a). High-Z characteristics are tested for all speeds
CY7C1041DV33
Unit
pF
pF
SOJ
TSOP II
Unit
Package
Package
°C/W
57.91
50.66
°C/W
36.73
17.17
90%
10%
Fall Time: 1 V/ns
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