Amptek X-123 User Manual - Page 12
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Print Page5.5. Amptek 25 mm
2
General
Detector Type
Silicon Drift Detector (SDD)
Detector Size
25 mm
Collimated Area
17 mm
Thickness
1000 m
Collimator Type
Internal Multilayer
Preamplifier Type
CMOS reset type
Energy resolution @ 5.9 keV (55Fe)
122 to 131 eV FWHM (guaranteed) at T
126 eV (typical) at 1.0 s
134 eV (typical) at 0.2 s
Other Performance
Peak to background
> 20,000:1 (typical)
Signal risetime
< 35 ns
Maximum
input
> 1 Mcps
count rate
Throughput
Determined
processor & its settings
count rate stability
Window Options
Be
1/3 mil (8 m)
1/2 mil (12.5 m)
1m Parylene on each
Signal Output
Sensitivity
3.6 mV/keV
Gain stability
<20 ppm/°C
Polarity
Positive signal
Reset range
-0.05 to 2 V (typical)
Cooling
Cooling performance
ΔT > 85°C
Cooler type
Two stage thermoelectric
Temp monitor
Diode
Power
XR-100FastSDD User Manual
x1mm thick FAST SDD® Specifications
2
2
=4.0 s
pk
by
signal
HV Bias
-400V @ 25 A (typical)
Max
cooling
3.5 V / 0.45A
power
Total power
< 2 W (full cooling)
Other
Operating range
-35°C to +80°C
Performance degrades at elevated
detector temperatures.
Storage
&
-40°C to +85°C, 10% to 90% RH
shipping
noncondensing
RoHS
Compliant
Lifetime
Typical 5 to 10 years, depending on
use
Warranty Period
1 year
Preamplifier Options
Amptek's FAST SDD® is available with the XR-100
preamplifier, with the PA210 or PA230 OEM
preamplifiers, or as part of the X-123 and X-55.
Signal Processing Options
Amptek's FAST SDD® may be used with Amptek's
DP5 or DP5-X, or the PX5, or as part of the X-123
or X-55.
Specification Notes
Performance listed here is measured at full
cooling (<220K).
The "peak to background ratio" is the ratio of
counts in the Mn Kα peak channel to the counts
at 1 keV.
"Gain stability" refers to the change in sensitivity
when the preamp temperature changes but the
detector temperature is stable.
Operating Notes
Detector must be operated with an appropriate
heat sink.
The FAST SDD® is suitable for vacuum
applications. Amptek provides several system
configurations.
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