Olympus Pom Manual de instruções - Página 13

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Test

Plates:

Insert the 1/4 wave length retardation plate Imica 147m,1'l or the

ting plate Igypsum 530m/1) into the provided windw at an angle of 45°.

They are used for examiation of the bi-refringence or warps and for

determination of the axis.

SPECIAL ACCESSORIES:

Berek Compensator:

Angle Indicator Dial.

A piece of calcite is set in this compensator to measure the

bi-refringence of the specimen.

The compensator is inserted into the

test plate window.

Readings taken

from

the angle indicator dial

combined with the data taken from the attached compensation curve

table will determine the retardation.

A bi-refringent specimen may be set at the extinct position stage

45° by the scale and clamp it at the diagonal posittion.

Then insert

the compensator, turn the dial until the

interferential color in zero

order appears in the center of the field.

Take the reading of the

angle.

Compare it on the compensation curve and obtain

the micron

valus of the retardation.

If the order doesn't lessen even by turning

the compensation dial, turn

the specimen 90° and repeat the same

procedure.

At the position of 30° on the indicator dial, the tcst plate will

become perpendicular to the optical axis with 0 retardation; therefore,

insertion and removal of the test plate is performed at this position.

If it is overly slanted it will get stuck at the inserting window.

Eyepiece Adaptor.

If the observer prefers to use an evepiece of

a standard microscope [with a smaller .lIS diamet-

en, he may remove the

['O\'[

eyepiece and replace

with this adaptor.

Then the normal evepiece may

be inserted in it.

This will make possible the

of the general eyepieces,

grain-size

measuring

evepieces, other specialized eyepieces.