Olympus BX51M Instructions Manual - Page 29

Browse online or download pdf Instructions Manual for Microscope Olympus BX51M. Olympus BX51M 36 pages. System metallurgical microscope

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Significance of Objective Name

(Examples)

LM : Long-WD metal observation

SLM : Superlong-WD metal observation

LC : Observation over glass plate

Glossary of Terms Used in the Optical Characteristics Table

Working distance (WD)

Number of aperture (NA) : Important figure determining the objective characteristics (resolution, focal depth and bright-

Resolution

Depth of focus

Field number

Field of view

(Plan)

PL : Plan, or correction of image curving on peripheral area.

: Metal observation (no cover)

: The distance from the top of specimen and the front lens of objective.

ness).

Resolution ............. Increases in proportion with the NA.

Focal depth ......... Decreases in proportion with the NA.

Brightness ............. Proportional with the square of NA (comparison under the same magnification).

: The limit that an objective can identify the images of two points that are close to each other,

expressed as the distance between the two points on the specimen.

: The maximum depth of the specimen at which the entire specimen can be brought into focus

simultaneously. This value increases when the aperture iris diaphragm is narrowed and de-

creases when the objective NA is increased.

: The diameter of the image area that can be observed through the eyepieces, expressed in mm.

: The diameter of the area observable on the specimen, expressed in mm.

100

None : UIS

: UIS 2

None : Achromat, or aberration correction with 2 wavelengths (red and bleu).

: Semi-Apochromat, or color aberration correction with visual wave-

lengths (bluish purple to red).

APO : Apochromat, or color aberration correction with all visual-domain

wavelength (purple to red).

None : Brightfield

: Darkfield

BDP : Brightfield or polarized

: IR light

Figure : Magnification

BX51M